The SPECTRO iQ II is designed to allow the use of a new generation of sample cups. They can be very accurately positioned, contributing to increased measurement precision. When analyzing liquids, powders or pressed pellets, a safety window can be fitted to the cup to prevent instrument contamination. Samples can be exchanged without switching off the X-ray tube, ensuring maximum reliability, a higher sample throughput and extended instrument performance.

An exceptionally powerful silicon drift detector - technologically derived from the detector in the premium performance SPECTRO XEPOS spectrometer - is used in the SPECTRO iQ II. The high spectral resolution and the good signal to background ratios are the basis for low detection limits, especially in difficult matrices. With the high count rate processing capability, the operator simultaneously profits from excellent reproducibility and accuracy with short measurement times.

For many applications the measurement precision of major components and the sensitivity for important trace elements place the SPECTRO iQ II into the same performance class as the much more expensive wavelength dispersive X-ray fluorescence spectrometers. Applications that were previously the domain of these types of instruments can now be handled using SPECTRO's unique energy-dispersive technology. Using an internal Pd collimator, the SPECTRO iQ II is capable of analyzing trace levels of elements like Zr and Mo. The determination of ultra-low sulfur contents in fuels can be accomplished in just a few hundred seconds. For a wide range of production processes, the SPECTRO iQ II also offers exceptional analytical performance for important low atomic number elements.