An onboard PC makes use of WindowsT operating system along with a simple, intuitive touch-screen display, making analysis easy for nontechnical operators, but advanced enough for even the more experienced user as well.

The PHOENIX II combines polarized source x-rays, a movable secondary target and a rugged gas-filled proportional counter detection system, giving the PHOENIX II improved performance for the measurement of low atomic number elements such as Mg, Al and Si as well as S and Cl. The prop counter detector design yields a high x-ray count rate throughput and makes use of x-ray filters to separate the spectral peaks of elements with adjacent atomic numbers. With its onboard computer, no external computer is needed. The PHOENIX II does not require an external mouse or keyboard, yet offers USB, VGA and Ethernet connections for networking and connecting to external devices. This compact, simple to operate XRF system offers a unique combination of high powered polarized x-rays and a high sample throughput with rugged detector at a very affordable price and low cost of ownership.